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Direct structural and chemical characterizations of metal oxide nanoparticles using high-voltage electron microscopy = 초고전압 투과전자현미경을 이용한 금속산화물 나노입자들의 원자 구조 및 화학 분석link Kim, Young-Min; 김영민; et al, 한국과학기술원, 2010 |
Quantitative evaluations of a high-voltage multiscan CCD camera Kim, YM; Lee, JeongYong; Moonen, D; Jang, KI; Kim, YJ, JOURNAL OF ELECTRON MICROSCOPY, v.56, pp.217 - 224, 2007-12 |
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