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Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films Schwarz, T.; Cojocaru-Miredin, O.; Choi, Pyuck-Pa; Mousel, M.; Redinger, A.; Siebentritt, S.; Raabe, D., JOURNAL OF APPLIED PHYSICS, v.118, no.9, 2015-09 |
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