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Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks Kyeong, Kiryong; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.31, no.3, pp.395 - 402, 2018-08 |
Quantitative Phase Imaging and Artificial Intelligence: A Review Jo, YoungJu; Cho, Hyungjoo; Lee, Sang Yun; Choi, Gunho; Kim, Geon; Min, Hyun-seok; Park, YongKeun, IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, v.25, no.1, pp.6800914, 2019-01 |
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