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A new extraction method to determine bias dependent source series resistance in GaAs FET's Kim, CH; Yoon, KS; Yang, JW; Lee, JH; Park, Chul Soon; Lee, JJ; Pyun, KE, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.46, no.9, pp.1242 - 1250, 1998-09 |
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