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Ultraviolet photon induced bulk, surface and interface modifications in n-Hg0.8Cd0.2Te in hydrogen environment Agnihotri, OP; Pal, R; Yang, KD; Bae, SH; Lee, SJ; Lee, MY; Choi, WS; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.7A, pp.4500 - 4502, 2002-07 |
Use and imaging performance of CMOS flat panel imager with LiF/ZnS(Ag) and Gadox scintillation screens for neutron radiography Cha, BK; Kim, JY; Kim, TJ; Sim, C; Cho, Gyuseong; Lee, DH; Seo, CW; et al, JOURNAL OF INSTRUMENTATION, v.6, no.1, 2011-01 |
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